Guided Dual Networks for Single Image Super-Resolution

Bibliographic Details
Title: Guided Dual Networks for Single Image Super-Resolution
Authors: Wenhui Chen, Chuangchuang Liu, Yitong Yan, Longcun Jin, Xianfang Sun, Xinyi Peng
Source: IEEE Access, Vol 8, Pp 93608-93620 (2020)
Publisher Information: IEEE, 2020.
Publication Year: 2020
Collection: LCC:Electrical engineering. Electronics. Nuclear engineering
Subject Terms: Convolutional neural network, dual network, generative adversarial network, single image super-resolution, Electrical engineering. Electronics. Nuclear engineering, TK1-9971
More Details: The PSNR-oriented super-resolution (SR) methods pursue high reconstruction accuracy, but tend to produce over-smoothed results and lose plenty of high-frequency details. The GAN-based SR methods aim to generate more photo-realistic images, but the hallucinatory details are often accompanied with unsatisfying artifacts and noise. To address these problems, we propose a guided dual super-resolution network (GDSR), which exploits the advantages of both the PSNR-oriented and the GAN-based methods to achieve a good trade-off between reconstruction accuracy and perceptual quality. Specifically, our network contains two branches, where one is trained to extract global information and the other to focus on detail information. In this way, our network simultaneously generates SR images with high accuracy and satisfactory visual quality. To obtain more high-frequency features, we use the global features extracted from the low-frequency branch to guide the training of the high-frequency branch. Besides, our method utilizes a mask network to adaptively recover the final super-resolved image. Extensive experiments on several standard benchmarks show that our proposed method achieves better performance compared with state-of-the-art methods. The source code and the results of our GDSR are available at https://github.com/wenchen4321/GDSR.
Document Type: article
File Description: electronic resource
Language: English
ISSN: 2169-3536
Relation: https://ieeexplore.ieee.org/document/9097227/; https://doaj.org/toc/2169-3536
DOI: 10.1109/ACCESS.2020.2995175
Access URL: https://doaj.org/article/c263d7417a5148b09af1cb847ab2a590
Accession Number: edsdoj.263d7417a5148b09af1cb847ab2a590
Database: Directory of Open Access Journals
More Details
ISSN:21693536
DOI:10.1109/ACCESS.2020.2995175
Published in:IEEE Access
Language:English