Infrared metamaterial for surface-enhanced infrared absorption spectroscopy: pushing the frontier of ultrasensitive on-chip sensing

Bibliographic Details
Title: Infrared metamaterial for surface-enhanced infrared absorption spectroscopy: pushing the frontier of ultrasensitive on-chip sensing
Authors: Hong Zhou, Dongxiao Li, Xindan Hui, Xiaojing Mu
Source: International Journal of Optomechatronics, Vol 15, Iss 1, Pp 97-119 (2021)
Publisher Information: Taylor & Francis Group, 2021.
Publication Year: 2021
Collection: LCC:Materials of engineering and construction. Mechanics of materials
LCC:Applied optics. Photonics
Subject Terms: infrared metamaterial, surface-enhanced infrared absorption, sensor, ultrasensitive sensing, machine learning, Materials of engineering and construction. Mechanics of materials, TA401-492, Applied optics. Photonics, TA1501-1820
More Details: Surface-enhanced infrared absorption (SEIRA) spectroscopy is a powerful technique that overcomes the issue of low molecular absorption cross-sections in infrared spectroscopy. Due to the collective oscillations of electrons in the infrared regime, SEIRA using resonant metamaterial provides greatly enhanced (up to 107) electromagnetic fields extending up to tens of nanometers from the metamaterial. The enhanced near-field enables spectroscopic analysis and ultrasensitive on-chip sensing of molecules. This interesting characteristic has aroused widespread attention from researchers to SEIRA technology, and various SEIRA-based sensing applications have been continuously emerging. Optimization of the signal enhancement to obtain high sensing performance is the developing main thread of SEIRA technology. In this Review, we provide a basic understanding of SEIRA’s sensing mechanism and theoretical model. With this background, several SEIRA optimizing methods are discussed, ranging from design, materials to algorithms. Additionally, perspectives about the future development trends of SEIRA technologies are discussed.
Document Type: article
File Description: electronic resource
Language: English
ISSN: 1559-9612
1559-9620
15599612
Relation: https://doaj.org/toc/1559-9612; https://doaj.org/toc/1559-9620
DOI: 10.1080/15599612.2021.1953199
Access URL: https://doaj.org/article/1b18a9bca3354dc28a5953f2d8b7a9b6
Accession Number: edsdoj.1b18a9bca3354dc28a5953f2d8b7a9b6
Database: Directory of Open Access Journals
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More Details
ISSN:15599612
15599620
DOI:10.1080/15599612.2021.1953199
Published in:International Journal of Optomechatronics
Language:English