Enhanced antireflective and laser damage resistance of refractive-index gradient SiO2 nanostructured films at 1064 nm

Bibliographic Details
Title: Enhanced antireflective and laser damage resistance of refractive-index gradient SiO2 nanostructured films at 1064 nm
Authors: Wan Lili, Yang Jie, Liu Xiaoru, Zhu Jiayi, Xu Gang, Hao Chenchun, Chen Xuecheng, Xiong Zhengwei
Source: Polish Journal of Chemical Technology, Vol 26, Iss 2, Pp 25-30 (2024)
Publisher Information: Sciendo, 2024.
Publication Year: 2024
Collection: LCC:Chemistry
Subject Terms: sio2 nanostructured films, sol-gel procedure, refractive-index gradient, antireflective, laser damage resistance, Chemistry, QD1-999
More Details: A facile sol-gel procedure was employed to create refractive-index gradient SiO2 antireflective (AR) films. A monolayer film, characterized by the porous crosslinking framework, was fabricated with a designed volume ratio mixture both with colloidal silica suspension and soluble organic polysiloxane. The upper layer for the bilayer film was a hexamethylisilazane (HMDS) modified colloidal silica suspension, leading to the film surface transfer to hydrophobic. The strategic design of nanostructures in the bottom and upper layers resulted in a refractive-index gradient SiO2 film with enhanced AR properties. The bilayer film demonstrated a transmittance of 99.5% at 1064 nm, accompanied by a notable reduction in reflectivity. Moreover, the laser-induced damage threshold of the bilayer film was increased by 30%, rising to as high as 24.7 J/cm2. The SiO2 nanostructured film both showed a refractive-index gradient structure with excellent AR properties and exhibited good laser damage resistance.
Document Type: article
File Description: electronic resource
Language: English
ISSN: 1899-4741
Relation: https://doaj.org/toc/1899-4741
DOI: 10.2478/pjct-2024-0014
Access URL: https://doaj.org/article/1362ff7af14f42d18ef80a62c802622e
Accession Number: edsdoj.1362ff7af14f42d18ef80a62c802622e
Database: Directory of Open Access Journals
More Details
ISSN:18994741
DOI:10.2478/pjct-2024-0014
Published in:Polish Journal of Chemical Technology
Language:English