Ultrashort Free-Electron Laser X-ray Pulses

Bibliographic Details
Title: Ultrashort Free-Electron Laser X-ray Pulses
Authors: Wolfram Helml, Ivanka Grguraš, Pavle N. Juranić, Stefan Düsterer, Tommaso Mazza, Andreas R. Maier, Nick Hartmann, Markus Ilchen, Gregor Hartmann, Luc Patthey, Carlo Callegari, John T. Costello, Michael Meyer, Ryan N. Coffee, Adrian L. Cavalieri, Reinhard Kienberger
Source: Applied Sciences, Vol 7, Iss 9, p 915 (2017)
Publisher Information: MDPI AG, 2017.
Publication Year: 2017
Collection: LCC:Technology
LCC:Engineering (General). Civil engineering (General)
LCC:Biology (General)
LCC:Physics
LCC:Chemistry
Subject Terms: free-electron laser, ultrashort pulse characterization, ultrafast X-ray physics, laser-dressed electron spectroscopy, Technology, Engineering (General). Civil engineering (General), TA1-2040, Biology (General), QH301-705.5, Physics, QC1-999, Chemistry, QD1-999
More Details: For the investigation of processes happening on the time scale of the motion of bound electrons, well-controlled X-ray pulses with durations in the few-femtosecond and even sub-femtosecond range are a necessary prerequisite. Novel free-electron lasers sources provide these ultrashort, high-brightness X-ray pulses, but their unique aspects open up concomitant challenges for their characterization on a suitable time scale. In this review paper we describe progress and results of recent work on ultrafast pulse characterization at soft and hard X-ray free-electron lasers. We report on different approaches to laser-assisted time-domain measurements, with specific focus on single-shot characterization of ultrashort X-ray pulses from self-amplified spontaneous emission-based and seeded free-electron lasers. The method relying on the sideband measurement of X-ray electron ionization in the presence of a dressing optical laser field is described first. When the X-ray pulse duration is shorter than half the oscillation period of the streaking field, few-femtosecond characterization becomes feasible via linear streaking spectroscopy. Finally, using terahertz fields alleviates the issue of arrival time jitter between streaking laser and X-ray pulse, but compromises the achievable temporal resolution. Possible solutions to these remaining challenges for single-shot, full time–energy characterization of X-ray free-electron laser pulses are proposed in the outlook at the end of the review.
Document Type: article
File Description: electronic resource
Language: English
ISSN: 2076-3417
Relation: https://www.mdpi.com/2076-3417/7/9/915; https://doaj.org/toc/2076-3417
DOI: 10.3390/app7090915
Access URL: https://doaj.org/article/0ab123e041c94decb4f37333c2e5fa6d
Accession Number: edsdoj.0ab123e041c94decb4f37333c2e5fa6d
Database: Directory of Open Access Journals
More Details
ISSN:20763417
DOI:10.3390/app7090915
Published in:Applied Sciences
Language:English