Linewidth Measurement of a Narrow-Linewidth Laser: Principles, Methods, and Systems

Bibliographic Details
Title: Linewidth Measurement of a Narrow-Linewidth Laser: Principles, Methods, and Systems
Authors: Jia-Qi Chen, Chao Chen, Jing-Jing Sun, Jian-Wei Zhang, Zhao-Hui Liu, Li Qin, Yong-Qiang Ning, Li-Jun Wang
Source: Sensors, Vol 24, Iss 11, p 3656 (2024)
Publisher Information: MDPI AG, 2024.
Publication Year: 2024
Collection: LCC:Chemical technology
Subject Terms: narrow-linewidth laser, delayed self-heterodyne, Brillouin, linewidth, Chemical technology, TP1-1185
More Details: Narrow-linewidth lasers mainly depend on the development of advanced laser linewidth measurement methods for related technological progress as key devices in satellite laser communications, precision measurements, ultra-high-speed optical communications, and other fields. This manuscript provides a theoretical analysis of linewidth characterization methods based on the beat frequency power spectrum and laser phase noise calculations, and elaborates on existing research of measurement technologies. In addition, to address the technical challenges of complex measurement systems that commonly rely on long optical fibers and significant phase noise jitter in the existing research, a short-delay self-heterodyne method based on coherent envelope spectrum demodulation was discussed in depth to reduce the phase jitter caused by 1/f noise. We assessed the performance parameters and testing conditions of different lasers, as well as the corresponding linewidth characterization methods, and analyzed the measurement accuracy and error sources of various methods.
Document Type: article
File Description: electronic resource
Language: English
ISSN: 1424-8220
Relation: https://www.mdpi.com/1424-8220/24/11/3656; https://doaj.org/toc/1424-8220
DOI: 10.3390/s24113656
Access URL: https://doaj.org/article/04992a9830b641d6aeb3eb21d5537a51
Accession Number: edsdoj.04992a9830b641d6aeb3eb21d5537a51
Database: Directory of Open Access Journals
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More Details
ISSN:14248220
DOI:10.3390/s24113656
Published in:Sensors
Language:English