Soft X-ray angle-resolved photoemission spectroscopy of heavily boron-doped superconducting diamond films

Bibliographic Details
Title: Soft X-ray angle-resolved photoemission spectroscopy of heavily boron-doped superconducting diamond films
Authors: T. Yokoya, T. Nakamura, T. Matushita, T. Muro, H. Okazaki, M. Arita, K. Shimada, H. Namatame, M. Taniguchi, Y. Takano, M. Nagao, T. Takenouchi, H. Kawarada and T. Oguchi
Source: Science and Technology of Advanced Materials, Vol 7, Iss S1, p S12 (2006)
Publisher Information: Taylor & Francis Group, 2006.
Publication Year: 2006
Collection: LCC:Materials of engineering and construction. Mechanics of materials
LCC:Biotechnology
Subject Terms: Materials of engineering and construction. Mechanics of materials, TA401-492, Biotechnology, TP248.13-248.65
More Details: We have performed soft X-ray angle-resolved photoemission spectroscopy (SXARPES) of microwave plasma-assisted chemical vapor deposition diamond films with different B concentrations in order to study the origin of the metallic behavior of superconducting diamond. SXARPES results clearly show valence band dispersions with a bandwidth of ~23 eV and with a top of the valence band at gamma point in the Brillouin zone, which are consistent with the calculated valence band dispersions of pure diamond. Boron concentration-dependent band dispersions near the Fermi level (EF) exhibit a systematic shift of EF, indicating depopulation of electrons due to hole doping. These SXARPES results indicate that diamond bands retain for heavy boron doping and holes in the diamond band are responsible for the metallic states leading to superconductivity at low temperature. A high-resolution photoemission spectroscopy spectrum near EF of a heavily boron-doped diamond superconductor is also presented.
Document Type: article
File Description: electronic resource
Language: English
ISSN: 1468-6996
1878-5514
Relation: http://www.iop.org/EJ/abstract/-search=58672466.17/1468-6996/7/S1/A04; https://doaj.org/toc/1468-6996; https://doaj.org/toc/1878-5514
Access URL: https://doaj.org/article/0312602091fe42758f3a2b60708c7c5c
Accession Number: edsdoj.0312602091fe42758f3a2b60708c7c5c
Database: Directory of Open Access Journals
More Details
ISSN:14686996
18785514
Published in:Science and Technology of Advanced Materials
Language:English