Simulation-guided analysis of resonant soft X-ray scattering for determining the microstructure of triblock copolymersElectronic supplementary information (ESI) available: Reagent information, synthetic methods, molecular characterization, automated flash chromatography method, optical microscopy of thin film samples for NEXAFS spectroscopy, refractive index calculation of mixtures, complex refractive indices and pairwise contrast functions of P4MCL, PTFEA, and PDDA, geometric derivations for structure models, radially-averaged RSoXS data, description of data reduction and peak fitting, complete set of scattering pattern simulations, relative root-mean-squared error calculation, discussion on the expected impact of varying cylinder orientation distributions. See DOI: https://doi.org/10.1039/d2me00096b