InAs Channel Inset Effects on the DC, RF, and Noise Properties of InP pHEMTs

Bibliographic Details
Title: InAs Channel Inset Effects on the DC, RF, and Noise Properties of InP pHEMTs
Authors: Ruiz, Diego C., Saranovac, Tamara, Han, Daxin, Hambitzer, Anna, Arabhavi, Akshay M., Ostinelli, Olivier, Bolognesi, C. R.
Source: IEEE transactions on electron devices. 66(11):4685-4691
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Database: British Library Document Supply Centre Inside Serials & Conference Proceedings
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ISSN:00189383
Published in:IEEE transactions on electron devices
Language:English