Microstructural Evolution of Intermetallic Compounds in TCNCP Cu Pillar Solder Joints

Bibliographic Details
Title: Microstructural Evolution of Intermetallic Compounds in TCNCP Cu Pillar Solder Joints
Authors: Liang, C. L., Lin, K. L., Peng, J. W.
Source: JOURNAL OF ELECTRONIC MATERIALS. 45(1):51-56
Availability: http://explore.bl.uk/primo_library/libweb/action/display.do?tabs=detailsTab&gathStatTab=true&ct=display&fn=search&doc=ETOCRN374058925&indx=1&recIds=ETOCRN374058925
Database: British Library Document Supply Centre Inside Serials & Conference Proceedings
More Details
ISSN:03615235
Published in:JOURNAL OF ELECTRONIC MATERIALS
Language:English