Bibliographic Details
| Title: |
Hyphenation of Surface Plasmon Resonance Imaging to Matrix-Assisted Laser Desorption Ionization Mass Spectrometry by On-Chip Mass Spectrometry and Tandem Mass Spectrometry Analysis |
| Authors: |
Bellon, S., Buchmann, W., Gonnet, F., Jarroux, N., Anger-Leroy, M., Guillonneau, F., Daniel, R. |
| Source: |
ANALYTICAL CHEMISTRY -WASHINGTON DC-. 81(18):7695-7702 |
| Availability: |
http://explore.bl.uk/primo_library/libweb/action/display.do?tabs=detailsTab&gathStatTab=true&ct=display&fn=search&doc=ETOCRN258347456&indx=1&recIds=ETOCRN258347456 |
| Database: |
British Library Document Supply Centre Inside Serials & Conference Proceedings |
