Analysis of defect-related optical degradation of VCSILs for photonic integrated circuits
| Title: | Analysis of defect-related optical degradation of VCSILs for photonic integrated circuits Vertical-Cavity Surface-Emitting Lasers XXVII |
|---|---|
| Authors: | Zenari, M., Buffolo, M., Fornasier, M., De Santi, C., Goyvaerts, J., Grabowski, A., Gustavsson, J., Kumari, S., Stassen, A., Baets, R. |
| Source: | Proceedings of SPIE, the International Society for Optical Engineering. 12439:124390E-124390E-9 |
| Availability: | http://explore.bl.uk/primo_library/libweb/action/display.do?tabs=detailsTab&gathStatTab=true&ct=display&fn=search&doc=ETOCCN900060906&indx=1&recIds=ETOCCN900060906 |
| Database: | British Library Document Supply Centre Inside Serials & Conference Proceedings |
| ISBN: | 9781510659834 1510659838 |
|---|---|
| ISSN: | 0277786X |
| Published in: | Proceedings of SPIE, the International Society for Optical Engineering |
| Language: | English |