APA (7th ed.) Citation

McBride, J. W., Cross, K. J., & Bull, T. G. (2019). Optical metrology for the morphological characterization of surfaces: Limitations, innovations, registration and new directions. Proceedings of SPIE, the International Society for Optical Engineering, 11189, 111890S.

Chicago Style (17th ed.) Citation

McBride, J. W., K. J. Cross, and T. G. Bull. "Optical Metrology for the Morphological Characterization of Surfaces: Limitations, Innovations, Registration and New Directions." Proceedings of SPIE, the International Society for Optical Engineering 11189 (2019): 111890S.

MLA (8th ed.) Citation

McBride, J. W., et al. "Optical Metrology for the Morphological Characterization of Surfaces: Limitations, Innovations, Registration and New Directions." Proceedings of SPIE, the International Society for Optical Engineering, vol. 11189, 2019, p. 111890S.

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