Bibliographic Details
| Title: |
Structural and Electrical Characterization of Ni-Based Ohmic Contacts on 4H-SiC Formed by Solid-State Laser Annealing
European conference on silicon carbide and related materials |
| Authors: |
Badalà, P., Smecca, E., Rascunà, S., Bongiorno, C., Carria, E., Bassi, A., Bellocchi, G., Castorina, S., Tringali, C., La Magna, A. |
| Source: |
Materials science forum. 1062:417-421 |
| Availability: |
http://explore.bl.uk/primo_library/libweb/action/display.do?tabs=detailsTab&gathStatTab=true&ct=display&fn=search&doc=ETOCCN607654304&indx=1&recIds=ETOCCN607654304 |
| Database: |
British Library Document Supply Centre Inside Serials & Conference Proceedings |
