Bibliographic Details
| Title: |
Shockley–Haynes Characterization of Minority-Carrier Drift Velocity, Diffusion Coefficient, and Lifetime in HgCdTe Avalanche Photodiodes
Physics and chemistry of II-VI materials |
| Authors: |
Rothman, J., Vojetta, G., Moselle, B., Mollard, L., Gout, S., Chamonal, J. P. |
| Source: |
JOURNAL OF ELECTRONIC MATERIALS. 39(7):837-845 |
| Availability: |
http://explore.bl.uk/primo_library/libweb/action/display.do?tabs=detailsTab&gathStatTab=true&ct=display&fn=search&doc=ETOCCN076882196&indx=1&recIds=ETOCCN076882196 |
| Database: |
British Library Document Supply Centre Inside Serials & Conference Proceedings |
