Understanding Metastable Defect Creation in CIGS by Detailed Device Modeling and Measurements on Bifacial Solar Cells

Bibliographic Details
Title: Understanding Metastable Defect Creation in CIGS by Detailed Device Modeling and Measurements on Bifacial Solar Cells
Thin-film compound semiconductor photovotaics
Authors: Lee, J., Needleman, D. B., Shafarman, W. N., Cohen, J. D.
Source: MATERIALS RESEARCH SOCIETY SYMPOSIUM PROCEEDINGS. 1012:223-228
Availability: http://explore.bl.uk/primo_library/libweb/action/display.do?tabs=detailsTab&gathStatTab=true&ct=display&fn=search&doc=ETOCCN067059619&indx=1&recIds=ETOCCN067059619
Database: British Library Document Supply Centre Inside Serials & Conference Proceedings