3D Simulation study of gate coupling and gate cross-interference in advanced floating gate non-volatile memories

Bibliographic Details
Title: 3D Simulation study of gate coupling and gate cross-interference in advanced floating gate non-volatile memories
International conference on memory technology and design
Authors: Ghetti, A., Bortesi, L., Vendrame, L.
Source: SOLID STATE ELECTRONICS. 49(11):1805-1812
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Database: British Library Document Supply Centre Inside Serials & Conference Proceedings
More Details
ISSN:00381101
Published in:SOLID STATE ELECTRONICS
Language:English