| Title: |
Simulated SAM A-scans on multiplayer MEMS components
Reliability of electron devices, failure physics and analysis; ESREF 2002 |
| Authors: |
Janting, J., Petersen, D. H., Greisen, C. |
| Source: |
MICROELECTRONICS RELIABILITY. 42(NO 9-11):1811-1814 |
| Availability: |
http://explore.bl.uk/primo_library/libweb/action/display.do?tabs=detailsTab&gathStatTab=true&ct=display&fn=search&doc=ETOCCN045311855&indx=1&recIds=ETOCCN045311855 |
| Database: |
British Library Document Supply Centre Inside Serials & Conference Proceedings |
