Simulated SAM A-scans on multiplayer MEMS components
| Title: | Simulated SAM A-scans on multiplayer MEMS components Reliability of electron devices, failure physics and analysis; ESREF 2002 |
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| Authors: | Janting, J., Petersen, D. H., Greisen, C. |
| Source: | MICROELECTRONICS RELIABILITY. 42(NO 9-11):1811-1814 |
| Availability: | http://explore.bl.uk/primo_library/libweb/action/display.do?tabs=detailsTab&gathStatTab=true&ct=display&fn=search&doc=ETOCCN045311855&indx=1&recIds=ETOCCN045311855 |
| Database: | British Library Document Supply Centre Inside Serials & Conference Proceedings |
| ISSN: | 00262714 |
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| Published in: | MICROELECTRONICS RELIABILITY |
| Language: | English |