High-throughput speckle spectrometers based on multifractal scattering media
Title: | High-throughput speckle spectrometers based on multifractal scattering media |
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Authors: | Kumar, Bhupesh, Zhu, Yilin, Negro, Luca Dal, Schulz, Sebastian A. |
Publication Year: | 2023 |
Collection: | Physics (Other) |
Subject Terms: | Physics - Optics |
More Details: | We present compact integrated speckle spectrometers based on monofractal and multifractal scattering media in a silicon-on-insulator platform. Through both numerical and experimental studies we demonstrate enhanced optical throughput, and hence signal-to-noise ratio, for a number of random structures with tailored multifractal geometries without affecting the spectral decay of the speckle correlation functions. Moreover, we show that the developed multifractal media outperform traditional scattering spectrometers based on uniform random distributions of scattering centers. Our findings establish the potential of low-density random media with multifractal correlations for integrated on-chip applications beyond what is possible with uncorrelated random disorder. |
Document Type: | Working Paper |
Access URL: | http://arxiv.org/abs/2311.02796 |
Accession Number: | edsarx.2311.02796 |
Database: | arXiv |
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Items | – Name: Title Label: Title Group: Ti Data: High-throughput speckle spectrometers based on multifractal scattering media – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AR" term="%22Kumar%2C+Bhupesh%22">Kumar, Bhupesh</searchLink><br /><searchLink fieldCode="AR" term="%22Zhu%2C+Yilin%22">Zhu, Yilin</searchLink><br /><searchLink fieldCode="AR" term="%22Negro%2C+Luca+Dal%22">Negro, Luca Dal</searchLink><br /><searchLink fieldCode="AR" term="%22Schulz%2C+Sebastian+A%2E%22">Schulz, Sebastian A.</searchLink> – Name: DatePubCY Label: Publication Year Group: Date Data: 2023 – Name: Subset Label: Collection Group: HoldingsInfo Data: Physics (Other) – Name: Subject Label: Subject Terms Group: Su Data: <searchLink fieldCode="DE" term="%22Physics+-+Optics%22">Physics - Optics</searchLink> – Name: Abstract Label: Description Group: Ab Data: We present compact integrated speckle spectrometers based on monofractal and multifractal scattering media in a silicon-on-insulator platform. Through both numerical and experimental studies we demonstrate enhanced optical throughput, and hence signal-to-noise ratio, for a number of random structures with tailored multifractal geometries without affecting the spectral decay of the speckle correlation functions. Moreover, we show that the developed multifractal media outperform traditional scattering spectrometers based on uniform random distributions of scattering centers. Our findings establish the potential of low-density random media with multifractal correlations for integrated on-chip applications beyond what is possible with uncorrelated random disorder. – Name: TypeDocument Label: Document Type Group: TypDoc Data: Working Paper – Name: URL Label: Access URL Group: URL Data: <link linkTarget="URL" linkTerm="http://arxiv.org/abs/2311.02796" linkWindow="_blank">http://arxiv.org/abs/2311.02796</link> – Name: AN Label: Accession Number Group: ID Data: edsarx.2311.02796 |
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RecordInfo | BibRecord: BibEntity: Subjects: – SubjectFull: Physics - Optics Type: general Titles: – TitleFull: High-throughput speckle spectrometers based on multifractal scattering media Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Kumar, Bhupesh – PersonEntity: Name: NameFull: Zhu, Yilin – PersonEntity: Name: NameFull: Negro, Luca Dal – PersonEntity: Name: NameFull: Schulz, Sebastian A. IsPartOfRelationships: – BibEntity: Dates: – D: 05 M: 11 Type: published Y: 2023 |
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