Reflection imaging with a helium zone plate microscope
| Title: | Reflection imaging with a helium zone plate microscope |
|---|---|
| Authors: | Flatabø, Ranveig, Eder, Sabrina D., Reisinger, Thomas, Bracco, Gianangelo, Baltzer, Peter, Samelin, Björn, Holst, Bodil |
| Publication Year: | 2023 |
| Collection: | Physics (Other) |
| Subject Terms: | Physics - Instrumentation and Detectors |
| More Details: | Neutral helium atom microscopy is a novel microscopy technique that offers strictly surface-sensitive, non-destructive imaging. Several experiments have been published in recent years where images are obtained by scanning a helium beam spot across a surface and recording the variation in scattered intensity at a fixed total scattering angle $\theta_{sd}$ and fixed incident angle $\theta_{i}$ relative to the overall surface normal. These experiments used a spot obtained by collimating the beam (referred to as helium pinhole microscopy). Alternatively, a beam spot can be created by focusing the beam with an atom optical element. However up till now imaging with a focused helium beam (referred to as helium zone plate microscopy) has only been demonstrated in transmission. Here we present the first reflection images obtained with a focused helium beam. Images are obtained with a spot size (FWHM) down to 4.7 $\mu$m $\pm$ 0.5 $\mu$m, and we demonstrate focusing down to a spot size of about 1 $\mu$m. Furthermore, we present the first experiments measuring the scattering distribution from a focused helium beam spot. The experiments are done by varying the incoming beam angle $\theta_{i}$ while keeping the beam-detector angle $\theta_{sd}$ and the point where the beam spot hits the surface fixed - in essence, a microscopy scale realization of a standard helium atom scattering experiment. Our experiments are done using an electron bombardment detector with adjustable signal accumulation, developed particularly for helium microscopy. Comment: 20 pages, 7 figures |
| Document Type: | Working Paper |
| Access URL: | http://arxiv.org/abs/2308.11749 |
| Accession Number: | edsarx.2308.11749 |
| Database: | arXiv |
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| Items | – Name: Title Label: Title Group: Ti Data: Reflection imaging with a helium zone plate microscope – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AR" term="%22Flatabø%2C+Ranveig%22">Flatabø, Ranveig</searchLink><br /><searchLink fieldCode="AR" term="%22Eder%2C+Sabrina+D%2E%22">Eder, Sabrina D.</searchLink><br /><searchLink fieldCode="AR" term="%22Reisinger%2C+Thomas%22">Reisinger, Thomas</searchLink><br /><searchLink fieldCode="AR" term="%22Bracco%2C+Gianangelo%22">Bracco, Gianangelo</searchLink><br /><searchLink fieldCode="AR" term="%22Baltzer%2C+Peter%22">Baltzer, Peter</searchLink><br /><searchLink fieldCode="AR" term="%22Samelin%2C+Björn%22">Samelin, Björn</searchLink><br /><searchLink fieldCode="AR" term="%22Holst%2C+Bodil%22">Holst, Bodil</searchLink> – Name: DatePubCY Label: Publication Year Group: Date Data: 2023 – Name: Subset Label: Collection Group: HoldingsInfo Data: Physics (Other) – Name: Subject Label: Subject Terms Group: Su Data: <searchLink fieldCode="DE" term="%22Physics+-+Instrumentation+and+Detectors%22">Physics - Instrumentation and Detectors</searchLink> – Name: Abstract Label: Description Group: Ab Data: Neutral helium atom microscopy is a novel microscopy technique that offers strictly surface-sensitive, non-destructive imaging. Several experiments have been published in recent years where images are obtained by scanning a helium beam spot across a surface and recording the variation in scattered intensity at a fixed total scattering angle $\theta_{sd}$ and fixed incident angle $\theta_{i}$ relative to the overall surface normal. These experiments used a spot obtained by collimating the beam (referred to as helium pinhole microscopy). Alternatively, a beam spot can be created by focusing the beam with an atom optical element. However up till now imaging with a focused helium beam (referred to as helium zone plate microscopy) has only been demonstrated in transmission. Here we present the first reflection images obtained with a focused helium beam. Images are obtained with a spot size (FWHM) down to 4.7 $\mu$m $\pm$ 0.5 $\mu$m, and we demonstrate focusing down to a spot size of about 1 $\mu$m. Furthermore, we present the first experiments measuring the scattering distribution from a focused helium beam spot. The experiments are done by varying the incoming beam angle $\theta_{i}$ while keeping the beam-detector angle $\theta_{sd}$ and the point where the beam spot hits the surface fixed - in essence, a microscopy scale realization of a standard helium atom scattering experiment. Our experiments are done using an electron bombardment detector with adjustable signal accumulation, developed particularly for helium microscopy.<br />Comment: 20 pages, 7 figures – Name: TypeDocument Label: Document Type Group: TypDoc Data: Working Paper – Name: URL Label: Access URL Group: URL Data: <link linkTarget="URL" linkTerm="http://arxiv.org/abs/2308.11749" linkWindow="_blank">http://arxiv.org/abs/2308.11749</link> – Name: AN Label: Accession Number Group: ID Data: edsarx.2308.11749 |
| PLink | https://login.libproxy.scu.edu/login?url=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edsarx&AN=edsarx.2308.11749 |
| RecordInfo | BibRecord: BibEntity: Subjects: – SubjectFull: Physics - Instrumentation and Detectors Type: general Titles: – TitleFull: Reflection imaging with a helium zone plate microscope Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Flatabø, Ranveig – PersonEntity: Name: NameFull: Eder, Sabrina D. – PersonEntity: Name: NameFull: Reisinger, Thomas – PersonEntity: Name: NameFull: Bracco, Gianangelo – PersonEntity: Name: NameFull: Baltzer, Peter – PersonEntity: Name: NameFull: Samelin, Björn – PersonEntity: Name: NameFull: Holst, Bodil IsPartOfRelationships: – BibEntity: Dates: – D: 22 M: 08 Type: published Y: 2023 |
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