Inhibited nonradiative decay at all exciton densities in monolayer semiconductors

Bibliographic Details
Title: Inhibited nonradiative decay at all exciton densities in monolayer semiconductors
Authors: Kim, Hyungjin, Uddin, Shiekh Zia, Higashitarumizu, Naoki, Rabani, Eran, Javey, Ali
Publication Year: 2021
Collection: Condensed Matter
Physics (Other)
Subject Terms: Condensed Matter - Materials Science, Condensed Matter - Mesoscale and Nanoscale Physics, Physics - Applied Physics
More Details: Most optoelectronic devices operate at high photocarrier densities, where all semiconductors suffer from enhanced nonradiative recombination. Nonradiative processes proportionately reduce photoluminescence (PL) quantum yield (QY), a performance metric that directly dictates the maximum device efficiency. Although transition-metal dichalcogenide (TMDC) monolayers exhibit near-unity PL QY at low exciton densities, nonradiative exciton-exciton annihilation (EEA) enhanced by van-Hove singularity (VHS) rapidly degrades their PL QY at high exciton densities and limits their utility in practical applications. Here, by applying small mechanical strain (< 1%), we circumvent VHS resonance and drastically suppress EEA in monolayer TMDCs, resulting in near-unity PL QY at all exciton densities despite the presence of a high native defect density. Our findings can enable light-emitting devices that retain high efficiency at all brightnesses.
Document Type: Working Paper
DOI: 10.1126/science.abi9193
Access URL: http://arxiv.org/abs/2107.10893
Accession Number: edsarx.2107.10893
Database: arXiv
More Details
DOI:10.1126/science.abi9193