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Rapid Thermal Annealing under O2Ambient to Recover the Deterioration by Gamma-Ray Irradiation in a-IGZO TFTs

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Title: Rapid Thermal Annealing under O2Ambient to Recover the Deterioration by Gamma-Ray Irradiation in a-IGZO TFTs
Authors: Park, Minah, Yoo, Jaewook, Lee, Hongseung, Song, Hyeonjun, Kim, Soyeon, Lim, Seongbin, Park, Seohyeon, Jeong, Jo Hak, Kim, Bongjoong, Lee, Kiyoung, Lee, Yoon Kyeung, Heo, Keun, Kwon, Jiseok, Bae, Hagyoul
Source: Electronic Materials Letters; January 2025, Vol. 21 Issue: 1 p111-118, 8p
Abstract: Graphical Abstract:
Database: Supplemental Index
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ISSN:17388090
20936788
DOI:10.1007/s13391-024-00526-8
Published in:Electronic Materials Letters
Language:English