Rapid Thermal Annealing under O2Ambient to Recover the Deterioration by Gamma-Ray Irradiation in a-IGZO TFTs
Title: | Rapid Thermal Annealing under O2Ambient to Recover the Deterioration by Gamma-Ray Irradiation in a-IGZO TFTs |
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Authors: | Park, Minah, Yoo, Jaewook, Lee, Hongseung, Song, Hyeonjun, Kim, Soyeon, Lim, Seongbin, Park, Seohyeon, Jeong, Jo Hak, Kim, Bongjoong, Lee, Kiyoung, Lee, Yoon Kyeung, Heo, Keun, Kwon, Jiseok, Bae, Hagyoul |
Source: | Electronic Materials Letters; January 2025, Vol. 21 Issue: 1 p111-118, 8p |
Abstract: | Graphical Abstract: |
Database: | Supplemental Index |
ISSN: | 17388090 20936788 |
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DOI: | 10.1007/s13391-024-00526-8 |
Published in: | Electronic Materials Letters |
Language: | English |