Bibliographic Details
| Title: |
High-sensitivity two-dimensional thermal- and mechanical-stress-induced birefringence measurements in a Nd:YAG rod |
| Authors: |
Ohmi, Masato, Akatsuka, Masanori, Ishikawa, Koji, Naito, Kenta, Yonezawa, Yoshiyuki, Nishida, Yoshio, Yamanaka, Masanobu, Izawa, Yasukazu, Nakai, Sadao |
| Source: |
Applied Optics; September 1994, Vol. 33 Issue: 27 p6368-6372, 5p |
| Abstract: |
A novel polarimeter for measuring the two-dimensional (2D) thermal- and mechanical-stress-induced birefringence in solid-state laser materials such as Nd:YAG is proposed. Using this device, we could sensitively measure the direction of the principal birefringence axis as well as the phase shift δ with sign when δ < π/4. The 2D thermal- and mechanical-stress-induced birefringence in a laser-diode-pumped Nd:YAG rod was successfully measured with the proposed polarimeter. We also found an active quarter-wave Nd:YAG phase retarder. |
| Database: |
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