Performance of immersion lithography for 45-nm-node CMOS and ultra-high density SRAM with 0.25um2.

Bibliographic Details
Title: Performance of immersion lithography for 45-nm-node CMOS and ultra-high density SRAM with 0.25um2.
Authors: Mimotogi, Shoji, Uesawa, Fumikatsu, Tominaga, Makoto, Fujise, Hiroharu, Sho, Koutaro, Katsumata, Mikio, Hane, Hiroki, Ikegami, Atsushi, Nagahara, Seiji, Ema, Tatsuhiko, Asano, Masafumi, Kanai, Hideki, Kimura, Taiki, Iwai, Masaaki
Source: Proceedings of SPIE; Nov2007, Issue 1, p652008-652008-9, 9p
Database: Complementary Index
More Details
ISSN:0277786X
DOI:10.1117/12.711049
Published in:Proceedings of SPIE
Language:English