Optical, structural and electrical characteristics of aluminum oxynitride thin films deposited in an Ar-N gas mixture RF-sputtering system.

Bibliographic Details
Title: Optical, structural and electrical characteristics of aluminum oxynitride thin films deposited in an Ar-N gas mixture RF-sputtering system.
Authors: Araiza, J. J., Aguilar-Frutis, M., Falcony, C.
Source: Journal of Materials Science: Materials in Electronics; October 2005, Vol. 16 Issue 10, p657-661, 5p
Database: Applied Science & Technology Source
More Details
ISSN:09574522
DOI:10.1007/s10854-005-3741-y
Published in:Journal of Materials Science: Materials in Electronics
Language:English