Raman scattering study of stoichiometric Si and Ge type II clathrates.
| Title: | Raman scattering study of stoichiometric Si and Ge type II clathrates. |
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| Authors: | Nolas, G. S., Kendziora, C. A., Gryko, Jan |
| Source: | Journal of Applied Physics; December 15 2002, Vol. 92 Issue 12, p7225-7230, 6p |
| Database: | Applied Science & Technology Source |
| ISSN: | 00218979 |
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| DOI: | 10.1063/1.1523146 |
| Published in: | Journal of Applied Physics |
| Language: | English |