On the use of pulsed DC bias for etching high aspect ratio features.

Bibliographic Details
Title: On the use of pulsed DC bias for etching high aspect ratio features.
Authors: Shi, Xingyi1, Xingyi_Shi@amat.com, Sadighi, Samaneh1, Rauf, Shahid1, Luo, Han1, Wang, Jun-Chieh1, Kenney, Jason1, Booth, Jean-Paul2, Marinov, Daniil2, Foucher, Mickaël2, Sirse, Nishant3
Source: Journal of Vacuum Science & Technology: Part A-Vacuums, Surfaces & Films; Jan/Feb2025, Vol. 43 Issue 1, p1-13, 13p
Database: Applied Science & Technology Source
More Details
ISSN:07342101
DOI:10.1116/6.0003943
Published in:Journal of Vacuum Science & Technology: Part A-Vacuums, Surfaces & Films
Language:English