Effects of Annealing Temperature on Bias Temperature Stress Stabilities of Bottom-Gate Coplanar In-Ga-Zn-O Thin-Film Transistors.
| Title: | Effects of Annealing Temperature on Bias Temperature Stress Stabilities of Bottom-Gate Coplanar In-Ga-Zn-O Thin-Film Transistors. |
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| Authors: | Chen, Yuyun1, yyunchen@goworld-lcd.com, Shen, Yi1, yishen@goworld-lcd.comymchen@goworld-lcd.com, Chen, Yuanming1, guodxu@goworld-lcd.com, Xu, Guodong1, ydliu@goworld-lcd.com, Liu, Yudong1, Huang, Rui2, yishen@goworld-lcd.com |
| Source: | Coatings (2079-6412); May2024, Vol. 14 Issue 5, p555, 14p |
| Database: | Applied Science & Technology Source |
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| ISSN: | 20796412 |
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| DOI: | 10.3390/coatings14050555 |
| Published in: | Coatings (2079-6412) |
| Language: | English |