Bibliographic Details
| Title: |
Complete polarization analysis of an APPLE II undulator using a soft X-ray polarimeter. |
| Authors: |
Wang, Hongchang, Bencok, Peter, Steadman, Paul, Longhi, Emily, Zhu, Jingtao, Wang, Zhanshan |
| Source: |
Journal of Synchrotron Radiation. Nov2012, Vol. 19 Issue 6, p944-948. 5p. |
| Subject Terms: |
*GRENZ rays, *WIGGLER magnets, *APPLE II (Computer), *OPTICAL polarization, *POLARISCOPE |
| Abstract: |
Two APPLE II undulators installed on the Diamond I10 beamline have all four magnet arrays shiftable and thus can generate linear polarization at any arbitrary angle from 0° to 180°, as well as all other states of elliptical polarization. To characterize the emitted radiation polarization state from one APPLE II undulator, the complete polarization measurement was performed using a multilayer-based soft X-ray polarimeter. The measurement results appear to show that the linear polarization angle offset is about 6° compared with other measurements at 712 eV, equivalent to an undulator jaw phase offset of 1.1 mm. In addition, the polarization states of various ellipticities have also been measured as a function of the undulator row phase. [ABSTRACT FROM AUTHOR] |
|
Copyright of Journal of Synchrotron Radiation is the property of Wiley-Blackwell and its content may not be copied or emailed to multiple sites or posted to a listserv without the copyright holder's express written permission. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.) |
| Database: |
Academic Search Complete |
