Bibliographic Details
| Title: |
Development of a soft X-ray angle-resolved photoemission system applicable to 100 µm crystals. |
| Authors: |
Muro, Takayuki, Kato, Yukako, Matsushita, Tomohiro, Kinoshita, Toyohiko, Watanabe, Yoshio, Okazaki, Hiroyuki, Yokoya, Takayoshi, Sekiyama, Akira, Suga, Shigemasa |
| Source: |
Journal of Synchrotron Radiation. Nov2011, Vol. 18 Issue 6, p879-884. 6p. |
| Subject Terms: |
*GRENZ rays, *PHOTOEMISSION, *X-ray spectra, *SYNCHROTRON radiation sources, *SILICON crystals, *PHOTON emission |
| Abstract: |
A system for angle-resolved photoemission spectroscopy (ARPES) of small single crystals with sizes down to 100 µm has been developed. Soft X-ray synchrotron radiation with a spot size of ∼40 µm × 65 µm at the sample position is used for the excitation. Using this system an ARPES measurement has been performed on a Si crystal of size 120 µm × 100 µm × 80 µm. The crystal was properly oriented on a sample stage by measuring the Laue spots. The crystal was cleaved in situ with a microcleaver at 100 K. The cleaved surface was adjusted to the beam spot using an optical microscope. Consequently, clear band dispersions along the Γ- X direction reflecting the bulk electronic states were observed with a photon energy of 879 eV. [ABSTRACT FROM AUTHOR] |
|
Copyright of Journal of Synchrotron Radiation is the property of Wiley-Blackwell and its content may not be copied or emailed to multiple sites or posted to a listserv without the copyright holder's express written permission. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.) |
| Database: |
Academic Search Complete |
