Binary Nanosystems Based on Amphiphilic Molecular Brushes Loaded with Radachlorine® Photosensitizer or Selenium Nanoparticles.

Bibliographic Details
Title: Binary Nanosystems Based on Amphiphilic Molecular Brushes Loaded with Radachlorine® Photosensitizer or Selenium Nanoparticles.
Authors: Valueva, S. V.1 (AUTHOR), Sukhanova, T. E.2 (AUTHOR) tat_sukhanova@bk.ru, Vylegzhanina, M. E.1 (AUTHOR), Meleshko, T. K.1 (AUTHOR)
Source: Technical Physics. Sep2020, Vol. 65 Issue 9, p1403-1410. 8p.
Subject Terms: *GRAFT copolymers, *ATOMIC force microscopy, *PHOTOSENSITIZERS, *SELENIUM, *MOLECULAR conformation, *POLYIMIDES, *SURFACE roughness
Abstract: The morphology, optical, and molecular-conformation characteristics of amphiphilic molecular brushes with a polyimide main chain and poly(methacrylic)acid acid side chains loaded with the second-generation photosensitizer Radachlorine® or a biogenic element (selenium in the zero-valence form Se0) nanoparticles are studied using atomic force microscopy, UV spectroscopy, and dynamic/static light scattering. The effect of density Z of grafts of poly(methacrylic)acid acid side chains and of the introduction of Radachlorine® or Se0 into amphiphilic molecular brushes on the size, spectral, and molecular conformation characteristics of synthesized binary nanosystems is demonstrated. A nonmonotonic dependence of the nanostructure size and the film surface roughness with increasing Z in binary systems with Radachlorine® and, conversely, a monotonic decrease in the nanostructure size and surface roughness for systems containing Se0 nanoparticles are observed. [ABSTRACT FROM AUTHOR]
Copyright of Technical Physics is the property of Springer Nature and its content may not be copied or emailed to multiple sites or posted to a listserv without the copyright holder's express written permission. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
Database: Academic Search Complete
Full text is not displayed to guests.
More Details
ISSN:10637842
DOI:10.1134/S1063784220090273
Published in:Technical Physics
Language:English