Non-uniform Image Defect Inspection Method

Bibliographic Details
Title:	Non-uniform Image Defect Inspection Method
Document Number:	20080107328
Publication Date:	May 8, 2008
Appl. No:	11/933511
Application Filed:	November 01, 2007
Abstract:	A non-uniform image defect inspection method includes steps of inputting an original two-dimensional image; separating a non-uniform background image from the original two-dimensional image by Discrete Cosine Transform (DCT) to obtain a residual image without the non-uniform background image; binarization segmenting the residual image to extract defects from the residual image, wherein the segmented defects are the inspection results.
Inventors:	Chen, Liang-Chia (Jhonehe City, TW); Kuo, Chia-Cheng (Yanshuei Township, TW)
Claim:	1. A non-uniform image defect inspection method, comprising steps of: a) inputting an original two-dimensional image; b) separating a non-uniform background image from the original two-dimensional image by Discrete Cosine Transform (DCT) to obtain a residual image without the non-uniform background image; and c) binarization segmenting the residual image to extract defects from the residual image so as to obtain inspection results.
Claim:	2. The non-uniform image defect inspection method of claim 1, wherein the step a) further comprise the follows steps: b1) performing a 2-D (two-dimensional) DCT operation on the original two-dimensional image to obtain DCT coefficients of a frequency domain; b2) selecting a cut-off frequency from the frequency domain and eliminating high-frequency DCT coefficients higher than the cut-off frequency; b3) performing a 2-D Inverse DCT (IDCT) operation to reconstruct a background image with a brightness distribution similar to the brightness distribution of the original two-dimensional image; and b4) subtracting the background image from the original two-dimensional image to remove the background with non-uniform brightness distribution and obtaining the residual image.
Claim:	3. The non-uniform image defect inspection method of claim 2, wherein in the step b2), the cut-off frequency is a frequency of the DCT coefficients on finishing a first order attenuation, wherein the DCT coefficients less than the cut-off frequency is remained, and the DCT coefficients higher than the cut-off frequency is eliminated through being set as 0.
Claim:	4. A non-uniform image defect inspection method, comprising steps of: a) inputting an original two-dimensional image; b) eliminating a non-uniform background image from the original two-dimensional image by performing a DCT operation to obtain a residual image without the non-uniform background image; c) binarization segmenting the residual image to extract the defects from the residual image; and d) performing quantified value analysis on the binarization segmented defect regions and setting a quantifying threshold, wherein regions with a corresponding quantified value less than the quantifying threshold are regarded as acceptable regions and eliminated, and the residual defect regions are the inspection results.
Claim:	5. The non-uniform image defect inspection method of claim 4, wherein the step b) further comprise the follows steps: b1) performing a 2-D DCT operation on the original two-dimensional image to obtain DCT coefficients of a frequency domain; b2) selecting a cut-off frequency from the frequency domain and eliminating high-frequency DCT coefficients higher than the cut-off frequency; b3) performing a 2-D IDCT operation to reconstruct a background image with a brightness distribution similar to the brightness distribution of the original two-dimensional image; and b4) subtracting the background image from the original two-dimensional image to remove the background having non-uniform brightness distribution and obtaining the residual image.
Claim:	6. The non-uniform image defect inspection method of claim 5, wherein in the step b2), the cut-off frequency is a frequency of the DCT coefficients on finishing a first order attenuation, wherein the DCT coefficients less than the cut-off frequency is remained, and the DCT coefficients higher then the cut-off frequency is eliminated through being set as 0.
Claim:	7. The non-uniform image defect inspection method of claim 4, wherein in the step d), the quantified value analysis is a quantified operation on SEMU values.
Current U.S. Class:	382149/000
Current International Class:	06; 06
Accession Number:	edspap.20080107328
Database:	USPTO Patent Applications

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Items	– Name: Title Label: Title Group: Ti Data: Non-uniform Image Defect Inspection Method – Name: DocumentID Label: Document Number Group: Patent Data: 20080107328 – Name: DateEntry Label: Publication Date Group: Patent Data: May 8, 2008 – Name: DocumentID Label: Appl. No Group: Patent Data: 11/933511 – Name: DateFiled Label: Application Filed Group: Patent Data: November 01, 2007 – Name: Abstract Label: Abstract Group: Ab Data: A non-uniform image defect inspection method includes steps of inputting an original two-dimensional image; separating a non-uniform background image from the original two-dimensional image by Discrete Cosine Transform (DCT) to obtain a residual image without the non-uniform background image; binarization segmenting the residual image to extract defects from the residual image, wherein the segmented defects are the inspection results. – Name: Author Label: Inventors Group: Patent Data: <searchLink fieldCode="ZA" term="%22Chen%2C+Liang-Chia%22">Chen, Liang-Chia</searchLink> (Jhonehe City, TW); <searchLink fieldCode="ZA" term="%22Kuo%2C+Chia-Cheng%22">Kuo, Chia-Cheng</searchLink> (Yanshuei Township, TW) – Name: Comment Label: Claim Group: Patent Data: 1. A non-uniform image defect inspection method, comprising steps of: a) inputting an original two-dimensional image; b) separating a non-uniform background image from the original two-dimensional image by Discrete Cosine Transform (DCT) to obtain a residual image without the non-uniform background image; and c) binarization segmenting the residual image to extract defects from the residual image so as to obtain inspection results. – Name: Comment Label: Claim Group: Patent Data: 2. The non-uniform image defect inspection method of claim 1, wherein the step a) further comprise the follows steps: b1) performing a 2-D (two-dimensional) DCT operation on the original two-dimensional image to obtain DCT coefficients of a frequency domain; b2) selecting a cut-off frequency from the frequency domain and eliminating high-frequency DCT coefficients higher than the cut-off frequency; b3) performing a 2-D Inverse DCT (IDCT) operation to reconstruct a background image with a brightness distribution similar to the brightness distribution of the original two-dimensional image; and b4) subtracting the background image from the original two-dimensional image to remove the background with non-uniform brightness distribution and obtaining the residual image. – Name: Comment Label: Claim Group: Patent Data: 3. The non-uniform image defect inspection method of claim 2, wherein in the step b2), the cut-off frequency is a frequency of the DCT coefficients on finishing a first order attenuation, wherein the DCT coefficients less than the cut-off frequency is remained, and the DCT coefficients higher than the cut-off frequency is eliminated through being set as 0. – Name: Comment Label: Claim Group: Patent Data: 4. A non-uniform image defect inspection method, comprising steps of: a) inputting an original two-dimensional image; b) eliminating a non-uniform background image from the original two-dimensional image by performing a DCT operation to obtain a residual image without the non-uniform background image; c) binarization segmenting the residual image to extract the defects from the residual image; and d) performing quantified value analysis on the binarization segmented defect regions and setting a quantifying threshold, wherein regions with a corresponding quantified value less than the quantifying threshold are regarded as acceptable regions and eliminated, and the residual defect regions are the inspection results. – Name: Comment Label: Claim Group: Patent Data: 5. The non-uniform image defect inspection method of claim 4, wherein the step b) further comprise the follows steps: b1) performing a 2-D DCT operation on the original two-dimensional image to obtain DCT coefficients of a frequency domain; b2) selecting a cut-off frequency from the frequency domain and eliminating high-frequency DCT coefficients higher than the cut-off frequency; b3) performing a 2-D IDCT operation to reconstruct a background image with a brightness distribution similar to the brightness distribution of the original two-dimensional image; and b4) subtracting the background image from the original two-dimensional image to remove the background having non-uniform brightness distribution and obtaining the residual image. – Name: Comment Label: Claim Group: Patent Data: 6. The non-uniform image defect inspection method of claim 5, wherein in the step b2), the cut-off frequency is a frequency of the DCT coefficients on finishing a first order attenuation, wherein the DCT coefficients less than the cut-off frequency is remained, and the DCT coefficients higher then the cut-off frequency is eliminated through being set as 0. – Name: Comment Label: Claim Group: Patent Data: 7. The non-uniform image defect inspection method of claim 4, wherein in the step d), the quantified value analysis is a quantified operation on SEMU values. – Name: CodeClass Label: Current U.S. Class Group: Patent Data: 382149/000 – Name: CodeClass Label: Current International Class Group: Patent Data: 06; 06 – Name: AN Label: Accession Number Group: ID Data: edspap.20080107328
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RecordInfo	BibRecord: BibEntity: Languages: – Text: English Titles: – TitleFull: Non-uniform Image Defect Inspection Method Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Chen, Liang-Chia – PersonEntity: Name: NameFull: Kuo, Chia-Cheng IsPartOfRelationships: – BibEntity: Dates: – D: 08 M: 05 Text: May 8, 2008 Type: published Y: 2008
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