Low-frequency noise characterization of positive bias stress effect on the spatial distribution of trap in β-Ga2O3 FinFET
| Title: | Low-frequency noise characterization of positive bias stress effect on the spatial distribution of trap in β-Ga2O3 FinFET |
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| Authors: | Bae, Hagyoul, Lee, Geon Bum, Yoo, Jaewook, Lee, Khwang-Sun, Ku, Ja-Yun, Kim, Kihyun, Kim, Jungsik, Ye, Peide D., Park, Jun-Young, Choi, Yang-Kyu |
| Source: | In Solid State Electronics May 2024 215 |
| Database: | ScienceDirect |
| ISSN: | 00381101 |
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| DOI: | 10.1016/j.sse.2024.108882 |
| Published in: | Solid State Electronics |
| Language: | English |