Choi, D., Lee, E., Nam, T., & Yook, J. (2022). Recent Trends in Image Information Recovery Using Leaked Electromagnetic Wave from Electronic Equipment. IEEE Electromagnetic Compatibility Magazine, Electromagnetic Compatibility Magazine, IEEE, IEEE Electromagn. Compat. Mag., 11(3), 77-83. https://doi.org/10.1109/MEMC.2022.9982567
Chicago Style (17th ed.) CitationChoi, Dong-Hoon, Euibum Lee, Taesik Nam, and Jong-Gwan Yook. "Recent Trends in Image Information Recovery Using Leaked Electromagnetic Wave from Electronic Equipment." IEEE Electromagnetic Compatibility Magazine, Electromagnetic Compatibility Magazine, IEEE, IEEE Electromagn. Compat. Mag. 11, no. 3 (2022): 77-83. https://doi.org/10.1109/MEMC.2022.9982567.
MLA (8th ed.) CitationChoi, Dong-Hoon, et al. "Recent Trends in Image Information Recovery Using Leaked Electromagnetic Wave from Electronic Equipment." IEEE Electromagnetic Compatibility Magazine, Electromagnetic Compatibility Magazine, IEEE, IEEE Electromagn. Compat. Mag., vol. 11, no. 3, 2022, pp. 77-83, https://doi.org/10.1109/MEMC.2022.9982567.
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