Cheon, G., Cubuk, E., Antoniuk, E., Blumberg, L., Goldberger, J., & Reed, E. (2021). Finding a Needle in a Haystack: Success stories of Data Mining and Machine Learning for Electronic Materials Selection. 2021 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA), VLSI Technology, Systems and Applications (VLSI-TSA), 2021 International Symposium on. https://doi.org/10.1109/VLSI-TSA51926.2021.9440106
Chicago Style (17th ed.) CitationCheon, G., E.D Cubuk, E. Antoniuk, L. Blumberg, J. Goldberger, and E. Reed. "Finding a Needle in a Haystack: Success Stories of Data Mining and Machine Learning for Electronic Materials Selection." 2021 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA), VLSI Technology, Systems and Applications (VLSI-TSA), 2021 International Symposium on 2021. https://doi.org/10.1109/VLSI-TSA51926.2021.9440106.
MLA (8th ed.) CitationCheon, G., et al. "Finding a Needle in a Haystack: Success Stories of Data Mining and Machine Learning for Electronic Materials Selection." 2021 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA), VLSI Technology, Systems and Applications (VLSI-TSA), 2021 International Symposium on, 2021, https://doi.org/10.1109/VLSI-TSA51926.2021.9440106.
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