Nondestructive Readout Memory Characteristics of Silicon Nanowire Biristors
| Title: | Nondestructive Readout Memory Characteristics of Silicon Nanowire Biristors |
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| Authors: | Lim, D., Kim, M., Kim, Y., Cho, J., Kim, S. |
| Source: | IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 65(4):1578-1582 Apr, 2018 |
| Database: | IEEE Xplore Digital Library |
| ISSN: | 00189383 15579646 |
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| DOI: | 10.1109/TED.2018.2802492 |
| Published in: | IEEE Transactions on Electron Devices, Electron Devices, IEEE Transactions on, IEEE Trans. Electron Devices |