Bibliographic Details
| Title: |
Circuit-based reliability consideration in FinFET technology |
| Authors: |
Lee, Y.-H., Liao, P. J., Joshi, K., Huang, D. S. |
| Source: |
2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) Physical and Failure Analysis of Integrated Circuits (IPFA), 2017 IEEE 24th International Symposium on the. :1-7 Jul, 2017 |
| Relation: |
2017 IEEE 24th International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) |
| Database: |
IEEE Xplore Digital Library |
