The importance of DFX, a foundry perspective
| Title: | The importance of DFX, a foundry perspective |
|---|---|
| Authors: | Adham, Saman, Chang, Jonathan, Liao, H.J., Hung, John, Hsieh, Ting-Hua |
| Source: | 2014 International Test Conference Test Conference (ITC), 2014 IEEE International. :1-6 Oct, 2014 |
| Relation: | 2014 IEEE International Test Conference (ITC) |
| Database: | IEEE Xplore Digital Library |
| FullText | Text: Availability: 0 CustomLinks: – Url: https://login.libproxy.scu.edu/login?url=https://ieeexplore.ieee.org/document/7035311 Name: EDS - IEEE (s8985755) Category: fullText Text: Check IEEE Xplore for full text MouseOverText: Check IEEE Xplore for full text. A new window will open. – Url: https://resolver.ebsco.com/c/xy5jbn/result?sid=EBSCO:edseee&genre=book&issn=10893539&ISBN=9781479947225&volume=&issue=&date=&spage=1&pages=1-6&title=2014 International Test Conference, Test Conference (ITC), 2014 IEEE International&atitle=The%20importance%20of%20DFX%2C%20a%20foundry%20perspective&aulast=Adham%2C%20Saman&id=DOI:10.1109/TEST.2014.7035311 Name: Full Text Finder (for New FTF UI) (s8985755) Category: fullText Text: Find It @ SCU Libraries MouseOverText: Find It @ SCU Libraries |
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| Header | DbId: edseee DbLabel: IEEE Xplore Digital Library An: edseee.7035311 RelevancyScore: 975 AccessLevel: 2 PubType: Conference PubTypeId: conference PreciseRelevancyScore: 974.638000488281 |
| IllustrationInfo | |
| Items | – Name: Title Label: Title Group: Ti Data: The importance of DFX, a foundry perspective – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AR" term="%22Adham%2C+Saman%22">Adham, Saman</searchLink><br /><searchLink fieldCode="AR" term="%22Chang%2C+Jonathan%22">Chang, Jonathan</searchLink><br /><searchLink fieldCode="AR" term="%22Liao%2C+H%2EJ%2E%22">Liao, H.J.</searchLink><br /><searchLink fieldCode="AR" term="%22Hung%2C+John%22">Hung, John</searchLink><br /><searchLink fieldCode="AR" term="%22Hsieh%2C+Ting-Hua%22">Hsieh, Ting-Hua</searchLink> – Name: TitleSource Label: Source Group: Src Data: 2014 International Test Conference Test Conference (ITC), 2014 IEEE International. :1-6 Oct, 2014 – Name: NoteTitleSource Label: Relation Group: SrcInfo Data: 2014 IEEE International Test Conference (ITC) |
| PLink | https://login.libproxy.scu.edu/login?url=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edseee&AN=edseee.7035311 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1109/TEST.2014.7035311 PhysicalDescription: Pagination: PageCount: 6 StartPage: 1 Titles: – TitleFull: The importance of DFX, a foundry perspective Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Adham, Saman – PersonEntity: Name: NameFull: Chang, Jonathan – PersonEntity: Name: NameFull: Liao, H.J. – PersonEntity: Name: NameFull: Hung, John – PersonEntity: Name: NameFull: Hsieh, Ting-Hua IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 10 Type: published Y: 2014 Identifiers: – Type: isbn-print Value: 9781479947225 – Type: issn-print Value: 10893539 – Type: issn-print Value: 23782250 – Type: issn-locals Value: edseee.IEEEConferenc Titles: – TitleFull: 2014 International Test Conference, Test Conference (ITC), 2014 IEEE International Type: main |
| ResultId | 1 |