An evaluation of Cu wiring in a production 64 Mb DRAM

Bibliographic Details
Title: An evaluation of Cu wiring in a production 64 Mb DRAM
Authors: Cote, W., Costrini, G., Edelstein, D., Osborn, C., Poindexter, D., Sardesai, V., Bronner, G.
Source: 1998 Symposium on VLSI Technology Digest of Technical Papers (Cat. No.98CH36216) VLSI technology VLSI Technology, 1998. Digest of Technical Papers. 1998 Symposium on. :24-25 1998
Relation: 1998 Symposium on VLSI Technology Digest of Technical Papers
Database: IEEE Xplore Digital Library