APA (7th ed.) Citation

Yu, T., Hsu, E., Liu, C., Colinge, J., Sheu, Y., Wu, J., & Diaz, C. H. (2013). Electrostatics and ballistic transport studies in junctionless nanowire transistors. 2013 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Simulation of Semiconductor Processes and Devices (SISPAD), 2013 International Conference on, 85-88. https://doi.org/10.1109/SISPAD.2013.6650580

Chicago Style (17th ed.) Citation

Yu, T.-H, Ethan Hsu, C.-W Liu, J.-P Colinge, Y.-M Sheu, Jeff Wu, and C. H. Diaz. "Electrostatics and Ballistic Transport Studies in Junctionless Nanowire Transistors." 2013 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Simulation of Semiconductor Processes and Devices (SISPAD), 2013 International Conference on 2013: 85-88. https://doi.org/10.1109/SISPAD.2013.6650580.

MLA (8th ed.) Citation

Yu, T.-H, et al. "Electrostatics and Ballistic Transport Studies in Junctionless Nanowire Transistors." 2013 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Simulation of Semiconductor Processes and Devices (SISPAD), 2013 International Conference on, 2013, pp. 85-88, https://doi.org/10.1109/SISPAD.2013.6650580.

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