Yu, T., Hsu, E., Liu, C., Colinge, J., Sheu, Y., Wu, J., & Diaz, C. H. (2013). Electrostatics and ballistic transport studies in junctionless nanowire transistors. 2013 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Simulation of Semiconductor Processes and Devices (SISPAD), 2013 International Conference on, 85-88. https://doi.org/10.1109/SISPAD.2013.6650580
Chicago Style (17th ed.) CitationYu, T.-H, Ethan Hsu, C.-W Liu, J.-P Colinge, Y.-M Sheu, Jeff Wu, and C. H. Diaz. "Electrostatics and Ballistic Transport Studies in Junctionless Nanowire Transistors." 2013 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Simulation of Semiconductor Processes and Devices (SISPAD), 2013 International Conference on 2013: 85-88. https://doi.org/10.1109/SISPAD.2013.6650580.
MLA (8th ed.) CitationYu, T.-H, et al. "Electrostatics and Ballistic Transport Studies in Junctionless Nanowire Transistors." 2013 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD), Simulation of Semiconductor Processes and Devices (SISPAD), 2013 International Conference on, 2013, pp. 85-88, https://doi.org/10.1109/SISPAD.2013.6650580.
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