Yoo, J., Choi, K., & Kang, S. (2007). A Junction Temperature Reduction Technique for a Microprocessor Considering Temperature Coupled Leakage Power. Twenty-Third Annual IEEE Semiconductor Thermal Measurement and Management Symposium, Semiconductor Thermal Measurement and Management Symposium, 2007. SEMI-THERM 2007. Twenty Third Annual IEEE, 74. https://doi.org/10.1109/STHERM.2007.352409

Yoo, Jaewook, Kiwon Choi, and Sayoon Kang. "A Junction Temperature Reduction Technique for a Microprocessor Considering Temperature Coupled Leakage Power." Twenty-Third Annual IEEE Semiconductor Thermal Measurement and Management Symposium, Semiconductor Thermal Measurement and Management Symposium, 2007. SEMI-THERM 2007. Twenty Third Annual IEEE 2007: 74. https://doi.org/10.1109/STHERM.2007.352409.

Yoo, Jaewook, et al. "A Junction Temperature Reduction Technique for a Microprocessor Considering Temperature Coupled Leakage Power." Twenty-Third Annual IEEE Semiconductor Thermal Measurement and Management Symposium, Semiconductor Thermal Measurement and Management Symposium, 2007. SEMI-THERM 2007. Twenty Third Annual IEEE, 2007, p. 74, https://doi.org/10.1109/STHERM.2007.352409.