Hafer, C., Schnathorst, V., Pfeil, J., Meade, T., Farris, T., & Jordan, A. (2005). SEE and TID results for a commercially fabricated radiation-hardened clock generator circuit. IEEE Radiation Effects Data Workshop, 2005., Radiation Effects Data Workshop, 2005. IEEE, Radiation Effects Data Workshop, 93-97. https://doi.org/10.1109/REDW.2005.1532672

Hafer, C., V. Schnathorst, J. Pfeil, T. Meade, T. Farris, and A. Jordan. "SEE and TID Results for a Commercially Fabricated Radiation-hardened Clock Generator Circuit." IEEE Radiation Effects Data Workshop, 2005., Radiation Effects Data Workshop, 2005. IEEE, Radiation Effects Data Workshop 2005: 93-97. https://doi.org/10.1109/REDW.2005.1532672.

Hafer, C., et al. "SEE and TID Results for a Commercially Fabricated Radiation-hardened Clock Generator Circuit." IEEE Radiation Effects Data Workshop, 2005., Radiation Effects Data Workshop, 2005. IEEE, Radiation Effects Data Workshop, 2005, pp. 93-97, https://doi.org/10.1109/REDW.2005.1532672.