Analysis of Breakdown Characteristics of a Pseudospark-Driven Electron Beam Source
| Title: | Analysis of Breakdown Characteristics of a Pseudospark-Driven Electron Beam Source |
|---|---|
| Authors: | Jain, S., Unadkat, P., Shukla, S., Kumar Singh, A., Ryskin, N.M., Kumar, N. |
| Source: | IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(11):7094-7098 Nov, 2024 |
| Database: | IEEE Xplore Digital Library |
| FullText | Links: – Type: other Text: Availability: 0 CustomLinks: – Url: https://login.libproxy.scu.edu/login?url=https://ieeexplore.ieee.org/document/10702429 Name: EDS - IEEE (s8985755) Category: fullText Text: Check IEEE Xplore for full text MouseOverText: Check IEEE Xplore for full text. A new window will open. – Url: https://resolver.ebsco.com/c/xy5jbn/result?sid=EBSCO:edseee&genre=article&issn=00189383&ISBN=&volume=71&issue=11&date=20241101&spage=7094&pages=7094-7098&title=IEEE Transactions on Electron Devices, Electron Devices, IEEE Transactions on, IEEE Trans. Electron Devices&atitle=Analysis%20of%20Breakdown%20Characteristics%20of%20a%20Pseudospark-Driven%20Electron%20Beam%20Source&aulast=Jain%2C%20S.&id=DOI:10.1109/TED.2024.3462684 Name: Full Text Finder (for New FTF UI) (s8985755) Category: fullText Text: Find It @ SCU Libraries MouseOverText: Find It @ SCU Libraries |
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| Header | DbId: edseee DbLabel: IEEE Xplore Digital Library An: edseee.10702429 RelevancyScore: 1143 AccessLevel: 2 PubType: Academic Journal PubTypeId: academicJournal PreciseRelevancyScore: 1143.02990722656 |
| IllustrationInfo | |
| Items | – Name: Title Label: Title Group: Ti Data: Analysis of Breakdown Characteristics of a Pseudospark-Driven Electron Beam Source – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AR" term="%22Jain%2C+S%2E%22">Jain, S.</searchLink><br /><searchLink fieldCode="AR" term="%22Unadkat%2C+P%2E%22">Unadkat, P.</searchLink><br /><searchLink fieldCode="AR" term="%22Shukla%2C+S%2E%22">Shukla, S.</searchLink><br /><searchLink fieldCode="AR" term="%22Kumar+Singh%2C+A%2E%22">Kumar Singh, A.</searchLink><br /><searchLink fieldCode="AR" term="%22Ryskin%2C+N%2EM%2E%22">Ryskin, N.M.</searchLink><br /><searchLink fieldCode="AR" term="%22Kumar%2C+N%2E%22">Kumar, N.</searchLink> – Name: TitleSource Label: Source Group: Src Data: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 71(11):7094-7098 Nov, 2024 |
| PLink | https://login.libproxy.scu.edu/login?url=https://search.ebscohost.com/login.aspx?direct=true&site=eds-live&scope=site&db=edseee&AN=edseee.10702429 |
| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1109/TED.2024.3462684 PhysicalDescription: Pagination: PageCount: 5 StartPage: 7094 Titles: – TitleFull: Analysis of Breakdown Characteristics of a Pseudospark-Driven Electron Beam Source Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Jain, S. – PersonEntity: Name: NameFull: Unadkat, P. – PersonEntity: Name: NameFull: Shukla, S. – PersonEntity: Name: NameFull: Kumar Singh, A. – PersonEntity: Name: NameFull: Ryskin, N.M. – PersonEntity: Name: NameFull: Kumar, N. IsPartOfRelationships: – BibEntity: Dates: – D: 01 M: 11 Type: published Y: 2024 Identifiers: – Type: issn-print Value: 00189383 – Type: issn-print Value: 15579646 – Type: issn-locals Value: edseee.IEEEJournals Numbering: – Type: volume Value: 71 – Type: issue Value: 11 Titles: – TitleFull: IEEE Transactions on Electron Devices, Electron Devices, IEEE Transactions on, IEEE Trans. Electron Devices Type: main |
| ResultId | 1 |