Jain, S., Unadkat, P., Shukla, S., Kumar Singh, A., Ryskin, N., & Kumar, N. (2024). Analysis of Breakdown Characteristics of a Pseudospark-Driven Electron Beam Source. IEEE Transactions on Electron Devices, Electron Devices, IEEE Transactions on, IEEE Trans. Electron Devices, 71(11), 7094-7098. https://doi.org/10.1109/TED.2024.3462684
Chicago Style (17th ed.) CitationJain, S., P. Unadkat, S. Shukla, A. Kumar Singh, N.M Ryskin, and N. Kumar. "Analysis of Breakdown Characteristics of a Pseudospark-Driven Electron Beam Source." IEEE Transactions on Electron Devices, Electron Devices, IEEE Transactions on, IEEE Trans. Electron Devices 71, no. 11 (2024): 7094-7098. https://doi.org/10.1109/TED.2024.3462684.
MLA (8th ed.) CitationJain, S., et al. "Analysis of Breakdown Characteristics of a Pseudospark-Driven Electron Beam Source." IEEE Transactions on Electron Devices, Electron Devices, IEEE Transactions on, IEEE Trans. Electron Devices, vol. 71, no. 11, 2024, pp. 7094-7098, https://doi.org/10.1109/TED.2024.3462684.
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