Kumar, A., Shrivastava, B. P., Kumar Gupta, T., Patel, V., & Gupta, V. (2024). Electrostatic Performance Enhanced in a Graded Doped Junctionless Gate All Around MOSFET. 2024 IEEE International Students' Conference on Electrical, Electronics and Computer Science (SCEECS), Electrical, Electronics and Computer Science (SCEECS), 2024 IEEE International Students' Conference on, 1-4. https://doi.org/10.1109/SCEECS61402.2024.10482181
Chicago Style (17th ed.) CitationKumar, Alok, Bhavana P. Shrivastava, Tarun Kumar Gupta, Vivek Patel, and Vidyadhar Gupta. "Electrostatic Performance Enhanced in a Graded Doped Junctionless Gate All Around MOSFET." 2024 IEEE International Students' Conference on Electrical, Electronics and Computer Science (SCEECS), Electrical, Electronics and Computer Science (SCEECS), 2024 IEEE International Students' Conference on 2024: 1-4. https://doi.org/10.1109/SCEECS61402.2024.10482181.
MLA (8th ed.) CitationKumar, Alok, et al. "Electrostatic Performance Enhanced in a Graded Doped Junctionless Gate All Around MOSFET." 2024 IEEE International Students' Conference on Electrical, Electronics and Computer Science (SCEECS), Electrical, Electronics and Computer Science (SCEECS), 2024 IEEE International Students' Conference on, 2024, pp. 1-4, https://doi.org/10.1109/SCEECS61402.2024.10482181.
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