High RA Dual-MTJ SOT-MRAM devices for High Speed (10ns) Compute-in-Memory Applications

Bibliographic Details
Title: High RA Dual-MTJ SOT-MRAM devices for High Speed (10ns) Compute-in-Memory Applications
Authors: Song, M. Y., Chen, K. L., Chen, K. M., Chang, K. T., Wang, I. J., Hsin, Y. C., Lin, C. Y., Ambrosi, E., Khwa, Win-San, Lu, Y. L., Hu, C. Y., Yang, S. Y., Li, S. H., Wei, J. H., Lee, T. Y., Wang, Y. J., Chang, M. F., Pai, C. F., Bao, X. Y.
Source: 2023 International Electron Devices Meeting (IEDM) Electron Devices Meeting (IEDM), 2023 International. :1-4 Dec, 2023
Relation: 2023 International Electron Devices Meeting (IEDM)
Database: IEEE Xplore Digital Library