Stecher, M. (2002). Automated measurement of emissions from equipment and systems. 2002 IEEE International Symposium on Electromagnetic Compatibility, Electromagnetic Compatibility, 2002. EMC 2002. IEEE International Symposium on, 2, 593-598. https://doi.org/10.1109/ISEMC.2002.1032658
Chicago Style (17th ed.) CitationStecher, M. "Automated Measurement of Emissions from Equipment and Systems." 2002 IEEE International Symposium on Electromagnetic Compatibility, Electromagnetic Compatibility, 2002. EMC 2002. IEEE International Symposium on 2 (2002): 593-598. https://doi.org/10.1109/ISEMC.2002.1032658.
MLA (8th ed.) CitationStecher, M. "Automated Measurement of Emissions from Equipment and Systems." 2002 IEEE International Symposium on Electromagnetic Compatibility, Electromagnetic Compatibility, 2002. EMC 2002. IEEE International Symposium on, vol. 2, 2002, pp. 593-598, https://doi.org/10.1109/ISEMC.2002.1032658.
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