Bodoh, D., Erington, K., Dickson, K., Lange, G., Wu, C., & Crawford, T. (2014). Root Cause Analysis Techniques Using Picosecond Time Resolved LADA. Proceedings / International Symposium for Testing and Failure Analysis, 40, 82-86.
Chicago Style (17th ed.) CitationBodoh, Dan, Kent Erington, Kris Dickson, George Lange, Carey Wu, and Tom Crawford. "Root Cause Analysis Techniques Using Picosecond Time Resolved LADA." Proceedings / International Symposium for Testing and Failure Analysis 40 (2014): 82-86.
MLA (8th ed.) CitationBodoh, Dan, et al. "Root Cause Analysis Techniques Using Picosecond Time Resolved LADA." Proceedings / International Symposium for Testing and Failure Analysis, vol. 40, 2014, pp. 82-86.
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