Angermann, H., Rappich, J., Sieber, I., Hübener, K., & Hauschild, J. (2008). Smoothing and passivation of special Si(111) substrates: Studied by SPV, PL, AFM and SEM measurements. ANALYTICAL AND BIOANALYTICAL CHEMISTRY, 390(6), 1463-1470.
Chicago Style (17th ed.) CitationAngermann, H., J. Rappich, I. Sieber, K. Hübener, and J. Hauschild. "Smoothing and Passivation of Special Si(111) Substrates: Studied by SPV, PL, AFM and SEM Measurements." ANALYTICAL AND BIOANALYTICAL CHEMISTRY 390, no. 6 (2008): 1463-1470.
MLA (8th ed.) CitationAngermann, H., et al. "Smoothing and Passivation of Special Si(111) Substrates: Studied by SPV, PL, AFM and SEM Measurements." ANALYTICAL AND BIOANALYTICAL CHEMISTRY, vol. 390, no. 6, 2008, pp. 1463-1470.
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