In situ TEM observation of nucleation and growth of spherical graphitic clusters under ion implantation.
| Title: | In situ TEM observation of nucleation and growth of spherical graphitic clusters under ion implantation. |
|---|---|
| Authors: | Abe, Hiroaki, Yamamoto, Shunya, Miyashita, Atsumi |
| Source: | Journal of Electron Microscopy; Mar2002 Supplement 1, Vol. 51, p183-187, 5p |
| Abstract: | Implantation with 100 keV C+ ions in a transmission electron microscope (TEM) was performed in copper at temperatures from 570 to 970 K to reveal the agglomeration process of implanted species immiscible in the substrates. Phase and strain contrast features with diameters of ∼5 nm appeared in Cu TEM samples at a fluence of 1 × 1017 C/cm2, at which carbon concentration and radiation damage were roughly evaluated as 10 at% and four displacements per carbon atom, respectively. The features were determined as carbon onions due to their spherical morphology and concentric graphene shells with the interlayer distance of bulk graphite. The strain contrast around onions indicated that they were embedded in the substrate enhancing isotropic strain. We have further derived evidence on the location of onions, such as the interaction of onions with dislocations and with the sample edge, the latter of which was observed due to irradiation‐enhanced evaporation of Cu. On the other hand, carbon nanocapsules (concentric graphitic spheres with cavities), typically observed in implanted polycrystalline Cu substrates, were formed through the graphitization at substrate grain boundaries and following emission of the encapsulated copper particles. [ABSTRACT FROM PUBLISHER] |
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| Items | – Name: Title Label: Title Group: Ti Data: In situ TEM observation of nucleation and growth of spherical graphitic clusters under ion implantation. – Name: Author Label: Authors Group: Au Data: <searchLink fieldCode="AR" term="%22Abe%2C+Hiroaki%22">Abe, Hiroaki</searchLink><br /><searchLink fieldCode="AR" term="%22Yamamoto%2C+Shunya%22">Yamamoto, Shunya</searchLink><br /><searchLink fieldCode="AR" term="%22Miyashita%2C+Atsumi%22">Miyashita, Atsumi</searchLink> – Name: TitleSource Label: Source Group: Src Data: Journal of Electron Microscopy; Mar2002 Supplement 1, Vol. 51, p183-187, 5p – Name: Abstract Label: Abstract Group: Ab Data: Implantation with 100 keV C+ ions in a transmission electron microscope (TEM) was performed in copper at temperatures from 570 to 970 K to reveal the agglomeration process of implanted species immiscible in the substrates. Phase and strain contrast features with diameters of ∼5 nm appeared in Cu TEM samples at a fluence of 1 × 1017 C/cm2, at which carbon concentration and radiation damage were roughly evaluated as 10 at% and four displacements per carbon atom, respectively. The features were determined as carbon onions due to their spherical morphology and concentric graphene shells with the interlayer distance of bulk graphite. The strain contrast around onions indicated that they were embedded in the substrate enhancing isotropic strain. We have further derived evidence on the location of onions, such as the interaction of onions with dislocations and with the sample edge, the latter of which was observed due to irradiation‐enhanced evaporation of Cu. On the other hand, carbon nanocapsules (concentric graphitic spheres with cavities), typically observed in implanted polycrystalline Cu substrates, were formed through the graphitization at substrate grain boundaries and following emission of the encapsulated copper particles. [ABSTRACT FROM PUBLISHER] – Name: Abstract Label: Group: Ab Data: <i>Copyright of Journal of Electron Microscopy is the property of Oxford University Press / USA and its content may not be copied or emailed to multiple sites or posted to a listserv without the copyright holder's express written permission. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.) |
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| RecordInfo | BibRecord: BibEntity: Identifiers: – Type: doi Value: 10.1093/jmicro/51.Supplement.S183 Languages: – Code: eng Text: English PhysicalDescription: Pagination: PageCount: 5 StartPage: 183 Titles: – TitleFull: In situ TEM observation of nucleation and growth of spherical graphitic clusters under ion implantation. Type: main BibRelationships: HasContributorRelationships: – PersonEntity: Name: NameFull: Abe, Hiroaki – PersonEntity: Name: NameFull: Yamamoto, Shunya – PersonEntity: Name: NameFull: Miyashita, Atsumi IsPartOfRelationships: – BibEntity: Dates: – D: 02 M: 03 Text: Mar2002 Supplement 1 Type: published Y: 2002 Identifiers: – Type: issn-print Value: 00220744 Numbering: – Type: volume Value: 51 Titles: – TitleFull: Journal of Electron Microscopy Type: main |
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