Rashid, S., Rossi, E., Diplas, S., Carvalho, P. A., Pucicki, D., Kuna, R., & Sebastiani, M. (2025). A Critical Comparison Among High-Resolution Methods for Spatially Resolved Nano-Scale Residual Stress Analysis in Nanostructured Coatings. International Journal of Molecular Sciences, 26(7), 3296-3312. https://doi.org/10.3390/ijms26073296

Rashid, Saqib, Edoardo Rossi, Spyros Diplas, Patricia Almeida Carvalho, Damian Pucicki, Rafal Kuna, and Marco Sebastiani. "A Critical Comparison Among High-Resolution Methods for Spatially Resolved Nano-Scale Residual Stress Analysis in Nanostructured Coatings." International Journal of Molecular Sciences 26, no. 7 (2025): 3296-3312. https://doi.org/10.3390/ijms26073296.

Rashid, Saqib, et al. "A Critical Comparison Among High-Resolution Methods for Spatially Resolved Nano-Scale Residual Stress Analysis in Nanostructured Coatings." International Journal of Molecular Sciences, vol. 26, no. 7, 2025, pp. 3296-3312, https://doi.org/10.3390/ijms26073296.